Heterojunction DDR THz IMPATT diodes based on Alx Ga1_xN/GaN material system

Simulation studies are made on the large-signal RF performance and avalanche noise properties ofhet- erojunction double-drift region （DDR） impact avalanche transit time （IMPATT） diodes based on AlxGal-xN/GaN material system designed to operate at 1.0 THz frequency. Two different heterojunction DDR s...

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Bibliographic Details
Published in:半导体学报：英文版 2015 (6), p.39-46
Main Author: Suranjana Banerjee Monojit Mitra
Format: Article
Language:English
Subjects:
DDR
p-GaN
太赫兹
射频性能
异质结
材料体系
氮化镓
雪崩二极管
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Summary:Simulation studies are made on the large-signal RF performance and avalanche noise properties ofhet- erojunction double-drift region （DDR） impact avalanche transit time （IMPATT） diodes based on AlxGal-xN/GaN material system designed to operate at 1.0 THz frequency. Two different heterojunction DDR structures such as n-Al0.4Ga0.6N/p-GaN and n-GaN/p-Al0.4Ga0.6N are proposed in this study. The large-signal output power, con- version efficiency and noise properties of the heterojunction DDR IMPATTs are compared with homojunction DDR IMPATT devices based on GaN and Al0.4Ga0.6N. The results show that the n-Al0.4Ga0.6N/p-GaN heterojunction DDR device not only surpasses the n-GaN/p-Al0.4Ga0.6N DDR device but also homojunction DDR IMPATTs based on GaN and Al0.4Ga0.6N as regards large-signal conversion efficiency, power output and avalanche noise performance at 1.0 THz.
ISSN:1674-4926