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Vacancy defect and defect cluster energetics in ion-implanted ZnO
We have used depth-resolved cathodoluminescence, positron annihilation, and surface photovoltage spectroscopies to determine the energy levels of Zn vacancies and vacancy clusters in bulk ZnO crystals. Doppler broadening-measured transformation of Zn vacancies to vacancy clusters with annealing shif...
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Published in: | Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2010-02, Vol.81 (8), Article 081201 |
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container_title | Physical review. B, Condensed matter and materials physics |
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creator | Dong, Yufeng Tuomisto, F. Svensson, B. G. Kuznetsov, A. Yu Brillson, Leonard J. |
description | We have used depth-resolved cathodoluminescence, positron annihilation, and surface photovoltage spectroscopies to determine the energy levels of Zn vacancies and vacancy clusters in bulk ZnO crystals. Doppler broadening-measured transformation of Zn vacancies to vacancy clusters with annealing shifts defect energies significantly lower in the ZnO band gap. Zn and corresponding O vacancy-related depth distributions provide a consistent explanation of depth-dependent resistivity and carrier-concentration changes induced by ion implantation.
© 2010 American Physical Society |
doi_str_mv | 10.1103/PhysRevB.81.081201 |
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title | Vacancy defect and defect cluster energetics in ion-implanted ZnO |
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