Modulating the field-effect passivation at the SiO2/c-Si interface: Analysis and verification of the photoluminescence imaging under applied bias method

Saved in:
Bibliographic Details
Main Authors: Haug, Halvard, Olibet, Sara, Nordseth, Ørnulf, Marstein, Erik Stensrud
Format: Article
Language:English
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary: