Measuring small lattice distortions in Si-crystals by phase-contrast x-ray topography

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 2000-11, Vol.33 (21), p.2678-2682, Article 2678
Main Authors: Bergamin, A, Cavagnero, G, Mana, G, Massa, E, Zosi, G
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Single-crystal and powder diffraction
Structure of solids and liquids
crystallography
X-ray diffraction and scattering
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ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/33/21/302