Electroreflectance of porous layers obtained by stain etching of laser modified silicon

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 2000-11, Vol.33 (22), p.2875-2879, Article 2875
Main Authors: Holiney, R Yu, Fedorenko, L L, Matveeva, L A, Strilchenko, I Yu, Venger, E F, Yusupov, N M
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electrooptical effects
Exact sciences and technology
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of bulk materials and thin films
Photoluminescence
Physics
Porous materials
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ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/33/22/302