Generation of Functional Broadside Tests for Transition Faults

Scan design allows a circuit to be tested using states that the circuit cannot enter during functional operation. It was observed that nonfunctional operation during testing may cause excessive currents that can cause a good chip to fail the test because of voltage droops caused by the excessive cur...

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Bibliographic Details
Published in:IEEE transactions on computer-aided design of integrated circuits and systems 2006-10, Vol.25 (10), p.2207-2218, Article 2207
Main Authors: Pomeranz, I., Reddy, S.M.
Format: Article
Language:English
Subjects:
Broadside tests
Chips
Circuit design
Circuit faults
Circuit simulation
Circuit testing
Circuits
Computer aided design
Current supplies
Design engineering
Electric potential
Electrical fault detection
Fault detection
Faults
Life testing
overtesting
Propagation delay
reachable states
Sequential analysis
transition faults
Voltage
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Summary:Scan design allows a circuit to be tested using states that the circuit cannot enter during functional operation. It was observed that nonfunctional operation during testing may cause excessive currents that can cause a good chip to fail the test because of voltage droops caused by the excessive current demand. A good chip may also fail due to the propagation of signal transitions along nonfunctional long paths, especially during at-speed testing. This problem is studied in this paper in the context of tests for transition faults. A method for determining transition faults that are untestable under functional operation-conditions is described. Two procedures for generating transition-fault tests that use only functional operation conditions are also described. The first procedure accepts as input a broadside test set for transition faults. The second procedure accepts as input a test sequence for the nonscan circuit. Although such a test sequence is more complex to generate and simulate, it results in higher numbers of faults detected under functional operation conditions
ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2005.860959