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Molecular surface orientation field of a langmuir monolayer determined by second-harmonic microscopy
The characterization of a Langmuir monolayer at a water surface by means of second‐harmonic microscopy (SHM) is reported. Details of the technique and the theory are presented in the following article. The application described here illustrates the main advantages of SHM: it provides quantitative in...
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Published in: | Advanced materials (Weinheim) 1997, Vol.9 (13), p.1056-1060 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The characterization of a Langmuir monolayer at a water surface by means of second‐harmonic microscopy (SHM) is reported. Details of the technique and the theory are presented in the following article. The application described here illustrates the main advantages of SHM: it provides quantitative information on the microscopic level and reveals additional information compared to linear microscopy techniques. It is demonstrated to open up new perspectives for the development and improvement of polar organic materials, starting from polar monolayers at an interface. |
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ISSN: | 0935-9648 1521-4095 |
DOI: | 10.1002/adma.19970091314 |