Cross-layer MAC design for location-aware wireless sensor networks

In this paper, we propose an optimization of MAC protocol design for wireless sensor networks, that accounts for cross‐layering information, in terms of location accuracy for nodes and residual energy levels. In our proposed solution we encode this cross‐layer information within a decreasing backoff...

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Bibliographic Details
Published in:International journal of communication systems 2011-07, Vol.24 (7), p.872-888
Main Authors: Shi, Qiong, Comaniciu, Cristina, Wang, Dandan, Tureli, Ufuk
Format: Article
Language:English
Subjects:
cross-layer design
location accuracy
MAC protocol
protocol optimization
wireless sensor networks
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Summary:In this paper, we propose an optimization of MAC protocol design for wireless sensor networks, that accounts for cross‐layering information, in terms of location accuracy for nodes and residual energy levels. In our proposed solution we encode this cross‐layer information within a decreasing backoff function in the MAC. The protocol is optimized by appropriately selecting priority window lengths, and we have shown that accurate cross‐layer information plays a crucial role in achieving an optimal performance at the MAC layer level. The estimation accuracy can be characterized spatially using a location reliability probability distribution function. We show that this distribution function greatly influences the design of the optimal backoff window parameters, and the overall throughput performance of the MAC protocol. Copyright © 2010 John Wiley & Sons, Ltd. In this paper, we propose a cross‐layer MAC design for wireless sensor networks, which prioritizes nodes with higher location estimation accuracy and higher residual energy levels. The cross‐layer information is encoded within a decreasing backoff function in the MAC. The protocol is optimized by appropriately selecting priority window lengths, and we have shown that accurate cross‐layer information plays a crucial role in achieving an optimal performance at the MAC layer level. Copyright © 2010 John Wiley & Sons, Ltd.
ISSN:1074-5351
1099-1131
DOI:10.1002/dac.1195