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Modeling of the J‐V Characteristics for ITO/CuPc/C 60 /Al Hetero‐Structure Solar Cells
The characteristics of current density ( J ) versus bias voltage ( V ) for various organic photovoltaic cells (OPVCs) with a basic hetero‐structure of ITO/CuPc/C 60 /Al are measured and analyzed by an equivalent circuit model. Two modeling schemes are developed and analyzed. The first one involves t...
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Published in: | Journal of the Chinese Chemical Society (Taipei) 2010-10, Vol.57 (5B), p.1185-1190 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The characteristics of current density (
J
) versus bias voltage (
V
) for various organic photovoltaic cells (OPVCs) with a basic hetero‐structure of ITO/CuPc/C
60
/Al are measured and analyzed by an equivalent circuit model. Two modeling schemes are developed and analyzed. The first one involves the direct fit of the
J‐V
data to the equation governed by the equivalent circuit. But for some of the
J‐V
data, the direct‐fit scheme occasionally leads to unrealistic fitting values. To maximize the usefulness of the equivalent circuit, a second modified scheme is then proposed and justified. Finally, together with experimental
J‐V
data and numerical fitting results, effects from the adding of C
60
hetero‐junction layer and from the changing of substrate temperature during the deposition of CuPc layer are discussed for various OPVCs. |
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ISSN: | 0009-4536 2192-6549 |
DOI: | 10.1002/jccs.201000172 |