Hyper‐Sampling Imaging by Measurement of Intra‐Pixel Quantum Efficiency Using Steady Wave Field

• Published in: Laser & photonics reviews 2024-11
• Main Authors: Xue, Hemeng, Shang, Mingtao, Zhang, Ze, Yu, Hongfei, Liang, Jinchao, Guan, Meiling, Sun, Chengming, Wang, Huahua, Wang, Shufeng, Ye, Zhengyu, Gao, Feng, Gao, Lu
• Format: Article
• Language: English
• ISSN: 1863-8880; 1863-8899
• DOI: 10.1002/lpor.202401306

The transition from optical film to digital image sensors (DIS) in imaging systems has brought great convenience to human life. However, the sampling resolution of DIS is considerably lower than that of optical film due to the limitation that the pixels are significantly larger than the silver halide molecules. How to break DIS's sampling limit and achieve high‐resolution imaging is highly desired for imaging applications. In the research, a novel mechanism that allows for a significant reduction in the smallest sampling unit of DIS to as small as 1/16th of a pixel, or even smaller, through measuring the intra‐pixel quantum efficiency for the first time and recomputing the image — a technique referred to as hyper‐sampling imaging (HSI) is developed. Employing the HSI method, the physical sampling resolution of regular DIS can be enhanced by 4 × 4 times or potentially higher, and detailed object information can be acquired. The HSI method has undergone rigorous testing in real‐world imaging scenarios, demonstrating its robustness and efficiency in overcoming the sampling constraints of conventional DIS. This advancement is particularly beneficial for applications such as remote sensing, long‐range reconnaissance, and astronomical observations, where the ability to capture fine details is paramount.