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Modeling control over determination of dielectric properties by the perturbation technique
An accompanying numerical simulation for obtaining field patterns, resonant frequencies, and the Q factor is proposed to evaluate the experimental conditions of complex permittivity reconstruction by the perturbation method and thereby improve its accuracy and flexibility. This approach is illustrat...
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Published in: | Microwave and optical technology letters 2003-12, Vol.39 (6), p.443-446 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | An accompanying numerical simulation for obtaining field patterns, resonant frequencies, and the Q factor is proposed to evaluate the experimental conditions of complex permittivity reconstruction by the perturbation method and thereby improve its accuracy and flexibility. This approach is illustrated by analyzing the measurement of dielectric constant and the loss tangent of wet movie film in a rectangular resonator. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 39: 443–446, 2003 |
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ISSN: | 0895-2477 1098-2760 |
DOI: | 10.1002/mop.11243 |