A method to obtain the isothermal static DC curves of microwave FET power amplifiers

This paper proposes a method to obtain the isothermal static DC curves of microwave FET power amplifiers, avoiding the use of pulsed measurements and accounting for the self‐heating problem in this type of device. The method requires the determination of the thermal resistance of the device under te...

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Bibliographic Details
Published in:Microwave and optical technology letters 2004-12, Vol.43 (5), p.378-380
Main Authors: Torregrosa-Penalva, G., Asensio-López, A., Blanco-del-Campo, A.
Format: Article
Language:English
Subjects:
electrothermal effects
FET power amplifiers
MMIC power amplifiers
temperature measurement
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Summary:This paper proposes a method to obtain the isothermal static DC curves of microwave FET power amplifiers, avoiding the use of pulsed measurements and accounting for the self‐heating problem in this type of device. The method requires the determination of the thermal resistance of the device under test and the measurement of its static DC curves under different ambient temperatures. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 43: 378–380, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20475
ISSN:0895-2477
1098-2760
DOI:10.1002/mop.20475