Structural evolution of cylindrical-phase diblock copolymer thin films

We have measured the time evolution of the self‐assembly process in perpendicular‐oriented cylindrical‐phase diblock copolymer thin films using statistical analysis of high‐resolution scanning electron microscope (SEM) images. Within minutes of annealing above the polymer glass‐transition temperatur...

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Bibliographic Details
Published in:Journal of polymer science. Part A, Polymer chemistry Polymer chemistry, 2004-04, Vol.42 (8), p.1970-1975
Main Authors: Black, C. T., Guarini, K. W.
Format: Article
Language:English
Subjects:
Applied sciences
coarsening
diblock copolymer
Exact sciences and technology
long-range ordering
Organic polymers
Physicochemistry of polymers
polymethylacrylate
polystyrene
Properties and characterization
self-assembly
structural evolution
structural evolution, polystyrene
Structure, morphology and analysis
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Summary:We have measured the time evolution of the self‐assembly process in perpendicular‐oriented cylindrical‐phase diblock copolymer thin films using statistical analysis of high‐resolution scanning electron microscope (SEM) images. Within minutes of annealing above the polymer glass‐transition temperature, microphase separation between polymer blocks results in formation of uniform nanometer‐scale domains whose relative position is initially largely uncorrelated. On further annealing, the cylindrical polymer domains organize into a two‐dimensional hexagonal lattice whose characteristic grain size increases slowly with time (∼t1/4). © 2004 Wiley Periodicals, Inc. J Polym Sci Part A: Polym Chem 42: 1970–1975, 2004 We have measured the time evolution of the structure of perpendicular‐oriented cylindrical‐phase diblock copolymer films using statistical analysis of high‐resolution scanning electron microscope (SEM) images.
ISSN:0887-624X
1099-0518
DOI:10.1002/pola.10977