Loading…

Improvement of Amorphous InGaZnO Thin‐Film Transistor Using High‐k SrTa 2 O 6 as Gate Insulator Deposited by Sputtering Method

Saved in:
Bibliographic Details
Published in:Physica status solidi. A, Applications and materials science Applications and materials science, 2019-03, Vol.216 (5)
Main Authors: Takahashi, Takanori, Hoga, Takeshi, Miyanaga, Ryoko, Oikawa, Kento, Fujii, Mami N., Ishikawa, Yasuaki, Uraoka, Yukiharu, Uchiyama, Kiyoshi
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c843-529b8af5bc9a97a179e40775c1383aa0a70e5ec60a486f080704231ec0568bc33
cites cdi_FETCH-LOGICAL-c843-529b8af5bc9a97a179e40775c1383aa0a70e5ec60a486f080704231ec0568bc33
container_end_page
container_issue 5
container_start_page
container_title Physica status solidi. A, Applications and materials science
container_volume 216
creator Takahashi, Takanori
Hoga, Takeshi
Miyanaga, Ryoko
Oikawa, Kento
Fujii, Mami N.
Ishikawa, Yasuaki
Uraoka, Yukiharu
Uchiyama, Kiyoshi
description
doi_str_mv 10.1002/pssa.201700773
format article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1002_pssa_201700773</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1002_pssa_201700773</sourcerecordid><originalsourceid>FETCH-LOGICAL-c843-529b8af5bc9a97a179e40775c1383aa0a70e5ec60a486f080704231ec0568bc33</originalsourceid><addsrcrecordid>eNo9kMFOg0AQhjdGE2v16nlegDrLAgvHptqWpKaH4sULGehSVgtLdqlJb8Yn8Bl9Eks0Pc0k8_9fMh9j9xwnHNF_6JyjiY9cIkopLtiIx5HvRYInl-cd8ZrdOPeGGISB5CP2lTadNR-qUW0PpoJpY2xXm4ODtF3Qa7uGrNbtz-f3XO8byCy1TrveWHhxut3BUu_q0_EdNjYj8GENEZCDBfXqBHCHPQ3ZR9UZp3u1heIIm-7Q98oO7WfV12Z7y64q2jt19z_HLJs_ZbOlt1ov0tl05ZVxILzQT4qYqrAoE0okcZmo4PRnWHIRCyIkiSpUZYQUxFGFMUoMfMFViWEUF6UQYzb5w5bWOGdVlXdWN2SPOcd8EJgPAvOzQPELVkhmPw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Improvement of Amorphous InGaZnO Thin‐Film Transistor Using High‐k SrTa 2 O 6 as Gate Insulator Deposited by Sputtering Method</title><source>Wiley</source><creator>Takahashi, Takanori ; Hoga, Takeshi ; Miyanaga, Ryoko ; Oikawa, Kento ; Fujii, Mami N. ; Ishikawa, Yasuaki ; Uraoka, Yukiharu ; Uchiyama, Kiyoshi</creator><creatorcontrib>Takahashi, Takanori ; Hoga, Takeshi ; Miyanaga, Ryoko ; Oikawa, Kento ; Fujii, Mami N. ; Ishikawa, Yasuaki ; Uraoka, Yukiharu ; Uchiyama, Kiyoshi</creatorcontrib><identifier>ISSN: 1862-6300</identifier><identifier>EISSN: 1862-6319</identifier><identifier>DOI: 10.1002/pssa.201700773</identifier><language>eng</language><ispartof>Physica status solidi. A, Applications and materials science, 2019-03, Vol.216 (5)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c843-529b8af5bc9a97a179e40775c1383aa0a70e5ec60a486f080704231ec0568bc33</citedby><cites>FETCH-LOGICAL-c843-529b8af5bc9a97a179e40775c1383aa0a70e5ec60a486f080704231ec0568bc33</cites><orcidid>0000-0001-7925-393X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Takahashi, Takanori</creatorcontrib><creatorcontrib>Hoga, Takeshi</creatorcontrib><creatorcontrib>Miyanaga, Ryoko</creatorcontrib><creatorcontrib>Oikawa, Kento</creatorcontrib><creatorcontrib>Fujii, Mami N.</creatorcontrib><creatorcontrib>Ishikawa, Yasuaki</creatorcontrib><creatorcontrib>Uraoka, Yukiharu</creatorcontrib><creatorcontrib>Uchiyama, Kiyoshi</creatorcontrib><title>Improvement of Amorphous InGaZnO Thin‐Film Transistor Using High‐k SrTa 2 O 6 as Gate Insulator Deposited by Sputtering Method</title><title>Physica status solidi. A, Applications and materials science</title><issn>1862-6300</issn><issn>1862-6319</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNo9kMFOg0AQhjdGE2v16nlegDrLAgvHptqWpKaH4sULGehSVgtLdqlJb8Yn8Bl9Eks0Pc0k8_9fMh9j9xwnHNF_6JyjiY9cIkopLtiIx5HvRYInl-cd8ZrdOPeGGISB5CP2lTadNR-qUW0PpoJpY2xXm4ODtF3Qa7uGrNbtz-f3XO8byCy1TrveWHhxut3BUu_q0_EdNjYj8GENEZCDBfXqBHCHPQ3ZR9UZp3u1heIIm-7Q98oO7WfV12Z7y64q2jt19z_HLJs_ZbOlt1ov0tl05ZVxILzQT4qYqrAoE0okcZmo4PRnWHIRCyIkiSpUZYQUxFGFMUoMfMFViWEUF6UQYzb5w5bWOGdVlXdWN2SPOcd8EJgPAvOzQPELVkhmPw</recordid><startdate>201903</startdate><enddate>201903</enddate><creator>Takahashi, Takanori</creator><creator>Hoga, Takeshi</creator><creator>Miyanaga, Ryoko</creator><creator>Oikawa, Kento</creator><creator>Fujii, Mami N.</creator><creator>Ishikawa, Yasuaki</creator><creator>Uraoka, Yukiharu</creator><creator>Uchiyama, Kiyoshi</creator><scope>AAYXX</scope><scope>CITATION</scope><orcidid>https://orcid.org/0000-0001-7925-393X</orcidid></search><sort><creationdate>201903</creationdate><title>Improvement of Amorphous InGaZnO Thin‐Film Transistor Using High‐k SrTa 2 O 6 as Gate Insulator Deposited by Sputtering Method</title><author>Takahashi, Takanori ; Hoga, Takeshi ; Miyanaga, Ryoko ; Oikawa, Kento ; Fujii, Mami N. ; Ishikawa, Yasuaki ; Uraoka, Yukiharu ; Uchiyama, Kiyoshi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c843-529b8af5bc9a97a179e40775c1383aa0a70e5ec60a486f080704231ec0568bc33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Takahashi, Takanori</creatorcontrib><creatorcontrib>Hoga, Takeshi</creatorcontrib><creatorcontrib>Miyanaga, Ryoko</creatorcontrib><creatorcontrib>Oikawa, Kento</creatorcontrib><creatorcontrib>Fujii, Mami N.</creatorcontrib><creatorcontrib>Ishikawa, Yasuaki</creatorcontrib><creatorcontrib>Uraoka, Yukiharu</creatorcontrib><creatorcontrib>Uchiyama, Kiyoshi</creatorcontrib><collection>CrossRef</collection><jtitle>Physica status solidi. A, Applications and materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Takahashi, Takanori</au><au>Hoga, Takeshi</au><au>Miyanaga, Ryoko</au><au>Oikawa, Kento</au><au>Fujii, Mami N.</au><au>Ishikawa, Yasuaki</au><au>Uraoka, Yukiharu</au><au>Uchiyama, Kiyoshi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Improvement of Amorphous InGaZnO Thin‐Film Transistor Using High‐k SrTa 2 O 6 as Gate Insulator Deposited by Sputtering Method</atitle><jtitle>Physica status solidi. A, Applications and materials science</jtitle><date>2019-03</date><risdate>2019</risdate><volume>216</volume><issue>5</issue><issn>1862-6300</issn><eissn>1862-6319</eissn><doi>10.1002/pssa.201700773</doi><orcidid>https://orcid.org/0000-0001-7925-393X</orcidid></addata></record>
fulltext fulltext
identifier ISSN: 1862-6300
ispartof Physica status solidi. A, Applications and materials science, 2019-03, Vol.216 (5)
issn 1862-6300
1862-6319
language eng
recordid cdi_crossref_primary_10_1002_pssa_201700773
source Wiley
title Improvement of Amorphous InGaZnO Thin‐Film Transistor Using High‐k SrTa 2 O 6 as Gate Insulator Deposited by Sputtering Method
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T15%3A19%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Improvement%20of%20Amorphous%20InGaZnO%20Thin%E2%80%90Film%20Transistor%20Using%20High%E2%80%90k%20SrTa%202%20O%206%20as%20Gate%20Insulator%20Deposited%20by%20Sputtering%20Method&rft.jtitle=Physica%20status%20solidi.%20A,%20Applications%20and%20materials%20science&rft.au=Takahashi,%20Takanori&rft.date=2019-03&rft.volume=216&rft.issue=5&rft.issn=1862-6300&rft.eissn=1862-6319&rft_id=info:doi/10.1002/pssa.201700773&rft_dat=%3Ccrossref%3E10_1002_pssa_201700773%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c843-529b8af5bc9a97a179e40775c1383aa0a70e5ec60a486f080704231ec0568bc33%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true