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Improvement of Amorphous InGaZnO Thin‐Film Transistor Using High‐k SrTa 2 O 6 as Gate Insulator Deposited by Sputtering Method
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Published in: | Physica status solidi. A, Applications and materials science Applications and materials science, 2019-03, Vol.216 (5) |
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container_issue | 5 |
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container_title | Physica status solidi. A, Applications and materials science |
container_volume | 216 |
creator | Takahashi, Takanori Hoga, Takeshi Miyanaga, Ryoko Oikawa, Kento Fujii, Mami N. Ishikawa, Yasuaki Uraoka, Yukiharu Uchiyama, Kiyoshi |
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doi_str_mv | 10.1002/pssa.201700773 |
format | article |
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language | eng |
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source | Wiley |
title | Improvement of Amorphous InGaZnO Thin‐Film Transistor Using High‐k SrTa 2 O 6 as Gate Insulator Deposited by Sputtering Method |
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