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Vibrational spectroscopy of SiO on Si(111)
The growth of ultrathin SiO layers on clean Si(111) was observed by in situ infrared spectroscopy under ultra‐high vacuum conditions. SiO was deposited by thermal evaporation of SiO powder from a Knudsen cell. A large shift of the SiO main vibrational line, from about 864 cm−1 for sub‐monolayer cove...
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Published in: | Physica status solidi. B. Basic research 2010-09, Vol.247 (9), p.2179-2184 |
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creator | Klevenz, Markus Wetzel, Steffen Trieloff, Mario Gail, Hans-Peter Pucci, Annemarie |
description | The growth of ultrathin SiO layers on clean Si(111) was observed by in situ infrared spectroscopy under ultra‐high vacuum conditions. SiO was deposited by thermal evaporation of SiO powder from a Knudsen cell. A large shift of the SiO main vibrational line, from about 864 cm−1 for sub‐monolayer coverage up to the bulk value of SiO at about 982 cm−1 for thicknesses above 10 Å, was observed. The extraordinary low vibrational frequencies for species at the SiO–Si interface corroborate recently published theoretical results for SiO adsorption on Si and for the SiO2–Si interface. |
doi_str_mv | 10.1002/pssb.200945550 |
format | article |
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SiO was deposited by thermal evaporation of SiO powder from a Knudsen cell. A large shift of the SiO main vibrational line, from about 864 cm−1 for sub‐monolayer coverage up to the bulk value of SiO at about 982 cm−1 for thicknesses above 10 Å, was observed. 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The extraordinary low vibrational frequencies for species at the SiO–Si interface corroborate recently published theoretical results for SiO adsorption on Si and for the SiO2–Si interface.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>infrared spectroscopy</subject><subject>Lattice dynamics</subject><subject>lattice properties</subject><subject>Phonons in low-dimensional structures and small particles</subject><subject>Physics</subject><subject>silicon monoxide</subject><issn>0370-1972</issn><issn>1521-3951</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNqFj81LwzAYxoMoOKdXz70IKnS-b9IkzVGH23TDDecHeAlpmkC1rqUZ6P57OyrDm6fn8vyeD0JOEQYIQK_qELIBBVAJ5xz2SA85xZgpjvukB0xCjErSQ3IUwjsASGTYI5cvRdaYdVGtTBmF2tl1UwVb1Zuo8tGymEfVqpVzRLw4JgfelMGd_GqfPI9un4aTeDYf3w2vZ7FlvC0RxkpFwadCpAjS5jwTWZ6js8KlPhMuTzJUqcwSTC3nXlikKgGVGk_RC8r6ZNDl2nZKaJzXdVN8mmajEfT2qd4-1bunLXDWAbUJ1pS-MStbhB1FGSolULQ-1fm-itJt_knVi-Xy5m9H3LFFWLvvHWuaDy0kk1y_Pow1Pr5N7kfTqV6wHyy3ciM</recordid><startdate>201009</startdate><enddate>201009</enddate><creator>Klevenz, Markus</creator><creator>Wetzel, Steffen</creator><creator>Trieloff, Mario</creator><creator>Gail, Hans-Peter</creator><creator>Pucci, Annemarie</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><general>Wiley-VCH</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>201009</creationdate><title>Vibrational spectroscopy of SiO on Si(111)</title><author>Klevenz, Markus ; Wetzel, Steffen ; Trieloff, Mario ; Gail, Hans-Peter ; Pucci, Annemarie</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3570-6ac7920f8668107cd5b6bdd1ec6e8fb6ed4b1987b418c55f6c1294098af21f623</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>infrared spectroscopy</topic><topic>Lattice dynamics</topic><topic>lattice properties</topic><topic>Phonons in low-dimensional structures and small particles</topic><topic>Physics</topic><topic>silicon monoxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Klevenz, Markus</creatorcontrib><creatorcontrib>Wetzel, Steffen</creatorcontrib><creatorcontrib>Trieloff, Mario</creatorcontrib><creatorcontrib>Gail, Hans-Peter</creatorcontrib><creatorcontrib>Pucci, Annemarie</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Physica status solidi. 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A large shift of the SiO main vibrational line, from about 864 cm−1 for sub‐monolayer coverage up to the bulk value of SiO at about 982 cm−1 for thicknesses above 10 Å, was observed. The extraordinary low vibrational frequencies for species at the SiO–Si interface corroborate recently published theoretical results for SiO adsorption on Si and for the SiO2–Si interface.</abstract><cop>Berlin</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/pssb.200945550</doi><tpages>6</tpages></addata></record> |
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subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology infrared spectroscopy Lattice dynamics lattice properties Phonons in low-dimensional structures and small particles Physics silicon monoxide |
title | Vibrational spectroscopy of SiO on Si(111) |
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