Nonparametric Synthetic Control Charts for Process Variation

In this article, we propose nonparametric synthetic and side‐sensitive synthetic control charts for controlling fraction nonconforming due to increase in the process variation. Synthetic control chart is a combination of sign and conforming run length control charts. We compare performance of the pr...

Full description

Saved in:
Bibliographic Details
Published in:Quality and reliability engineering international 2012-03, Vol.28 (2), p.193-202
Main Authors: Khilare, S. K., Shirke, D. T.
Format: Article
Language:English
Subjects:
average run length
Markov chain
nonparametric control chart
side-sensitive
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by cdi_FETCH-LOGICAL-c3033-bbaa8e12a1dca5311e4c7087fb5ebce8dd83065123f5ea7e8e097136a79c4d563
cites cdi_FETCH-LOGICAL-c3033-bbaa8e12a1dca5311e4c7087fb5ebce8dd83065123f5ea7e8e097136a79c4d563
container_end_page 202
container_issue 2
container_start_page 193
container_title Quality and reliability engineering international
container_volume 28
creator Khilare, S. K.
Shirke, D. T.
description In this article, we propose nonparametric synthetic and side‐sensitive synthetic control charts for controlling fraction nonconforming due to increase in the process variation. Synthetic control chart is a combination of sign and conforming run length control charts. We compare performance of the proposed control charts with the Shewhart sign and S2 charts. Our performance study shows that the proposed control charts have a higher power of detecting out‐of‐control signal. We also study the steady‐state behavior of a nonparametric synthetic control chart. We present a Markov chain model to evaluate the steady‐state average run length of the synthetic and side‐sensitive synthetic control charts. Copyright © 2011 John Wiley & Sons, Ltd.
doi_str_mv 10.1002/qre.1233
format article
fullrecord <record><control><sourceid>wiley_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1002_qre_1233</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>QRE1233</sourcerecordid><originalsourceid>FETCH-LOGICAL-c3033-bbaa8e12a1dca5311e4c7087fb5ebce8dd83065123f5ea7e8e097136a79c4d563</originalsourceid><addsrcrecordid>eNp1z0FLwzAUwPEgCs4p-BF69NKZNG2Tghcts4rbdDr1GF7TV1bdmpkEtN_ejongwdN7hx-P9yfklNERozQ6_7A4YhHne2TAaJaFLOVynwyoiGUoKROH5Mi5N0p7nMkBuZiZdgMW1uhto4OnrvVL9P2Wm9ZbswryJVjvgtrY4MEajc4FL2Ab8I1pj8lBDSuHJz9zSJ6vx4v8JpzcF7f55STUnHIeliWARBYBqzQknDGMtaBS1GWCpUZZVZLTNOm_rhMEgRJpJhhPQWQ6rpKUD8nZ7q62xjmLtdrYZg22U4yqbbXqq9W2uqfhjn42K-z-dWr-OP7rG-fx69eDfVep4CJRr7NCLebRlZwWU3XHvwHNu2hW</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Nonparametric Synthetic Control Charts for Process Variation</title><source>Wiley-Blackwell Read &amp; Publish Collection</source><creator>Khilare, S. K. ; Shirke, D. T.</creator><creatorcontrib>Khilare, S. K. ; Shirke, D. T.</creatorcontrib><description>In this article, we propose nonparametric synthetic and side‐sensitive synthetic control charts for controlling fraction nonconforming due to increase in the process variation. Synthetic control chart is a combination of sign and conforming run length control charts. We compare performance of the proposed control charts with the Shewhart sign and S2 charts. Our performance study shows that the proposed control charts have a higher power of detecting out‐of‐control signal. We also study the steady‐state behavior of a nonparametric synthetic control chart. We present a Markov chain model to evaluate the steady‐state average run length of the synthetic and side‐sensitive synthetic control charts. Copyright © 2011 John Wiley &amp; Sons, Ltd.</description><identifier>ISSN: 0748-8017</identifier><identifier>EISSN: 1099-1638</identifier><identifier>DOI: 10.1002/qre.1233</identifier><language>eng</language><publisher>Chichester, UK: John Wiley &amp; Sons, Ltd</publisher><subject>average run length ; Markov chain ; nonparametric control chart ; side-sensitive</subject><ispartof>Quality and reliability engineering international, 2012-03, Vol.28 (2), p.193-202</ispartof><rights>Copyright © 2011 John Wiley &amp; Sons, Ltd.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3033-bbaa8e12a1dca5311e4c7087fb5ebce8dd83065123f5ea7e8e097136a79c4d563</citedby><cites>FETCH-LOGICAL-c3033-bbaa8e12a1dca5311e4c7087fb5ebce8dd83065123f5ea7e8e097136a79c4d563</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Khilare, S. K.</creatorcontrib><creatorcontrib>Shirke, D. T.</creatorcontrib><title>Nonparametric Synthetic Control Charts for Process Variation</title><title>Quality and reliability engineering international</title><addtitle>Qual. Reliab. Engng. Int</addtitle><description>In this article, we propose nonparametric synthetic and side‐sensitive synthetic control charts for controlling fraction nonconforming due to increase in the process variation. Synthetic control chart is a combination of sign and conforming run length control charts. We compare performance of the proposed control charts with the Shewhart sign and S2 charts. Our performance study shows that the proposed control charts have a higher power of detecting out‐of‐control signal. We also study the steady‐state behavior of a nonparametric synthetic control chart. We present a Markov chain model to evaluate the steady‐state average run length of the synthetic and side‐sensitive synthetic control charts. Copyright © 2011 John Wiley &amp; Sons, Ltd.</description><subject>average run length</subject><subject>Markov chain</subject><subject>nonparametric control chart</subject><subject>side-sensitive</subject><issn>0748-8017</issn><issn>1099-1638</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNp1z0FLwzAUwPEgCs4p-BF69NKZNG2Tghcts4rbdDr1GF7TV1bdmpkEtN_ejongwdN7hx-P9yfklNERozQ6_7A4YhHne2TAaJaFLOVynwyoiGUoKROH5Mi5N0p7nMkBuZiZdgMW1uhto4OnrvVL9P2Wm9ZbswryJVjvgtrY4MEajc4FL2Ab8I1pj8lBDSuHJz9zSJ6vx4v8JpzcF7f55STUnHIeliWARBYBqzQknDGMtaBS1GWCpUZZVZLTNOm_rhMEgRJpJhhPQWQ6rpKUD8nZ7q62xjmLtdrYZg22U4yqbbXqq9W2uqfhjn42K-z-dWr-OP7rG-fx69eDfVep4CJRr7NCLebRlZwWU3XHvwHNu2hW</recordid><startdate>201203</startdate><enddate>201203</enddate><creator>Khilare, S. K.</creator><creator>Shirke, D. T.</creator><general>John Wiley &amp; Sons, Ltd</general><scope>BSCLL</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>201203</creationdate><title>Nonparametric Synthetic Control Charts for Process Variation</title><author>Khilare, S. K. ; Shirke, D. T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3033-bbaa8e12a1dca5311e4c7087fb5ebce8dd83065123f5ea7e8e097136a79c4d563</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>average run length</topic><topic>Markov chain</topic><topic>nonparametric control chart</topic><topic>side-sensitive</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Khilare, S. K.</creatorcontrib><creatorcontrib>Shirke, D. T.</creatorcontrib><collection>Istex</collection><collection>CrossRef</collection><jtitle>Quality and reliability engineering international</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Khilare, S. K.</au><au>Shirke, D. T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nonparametric Synthetic Control Charts for Process Variation</atitle><jtitle>Quality and reliability engineering international</jtitle><addtitle>Qual. Reliab. Engng. Int</addtitle><date>2012-03</date><risdate>2012</risdate><volume>28</volume><issue>2</issue><spage>193</spage><epage>202</epage><pages>193-202</pages><issn>0748-8017</issn><eissn>1099-1638</eissn><abstract>In this article, we propose nonparametric synthetic and side‐sensitive synthetic control charts for controlling fraction nonconforming due to increase in the process variation. Synthetic control chart is a combination of sign and conforming run length control charts. We compare performance of the proposed control charts with the Shewhart sign and S2 charts. Our performance study shows that the proposed control charts have a higher power of detecting out‐of‐control signal. We also study the steady‐state behavior of a nonparametric synthetic control chart. We present a Markov chain model to evaluate the steady‐state average run length of the synthetic and side‐sensitive synthetic control charts. Copyright © 2011 John Wiley &amp; Sons, Ltd.</abstract><cop>Chichester, UK</cop><pub>John Wiley &amp; Sons, Ltd</pub><doi>10.1002/qre.1233</doi><tpages>10</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0748-8017
ispartof Quality and reliability engineering international, 2012-03, Vol.28 (2), p.193-202
issn 0748-8017
1099-1638
language eng
recordid cdi_crossref_primary_10_1002_qre_1233
source Wiley-Blackwell Read & Publish Collection
subjects average run length
Markov chain
nonparametric control chart
side-sensitive
title Nonparametric Synthetic Control Charts for Process Variation
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-12T20%3A03%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-wiley_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Nonparametric%20Synthetic%20Control%20Charts%20for%20Process%20Variation&rft.jtitle=Quality%20and%20reliability%20engineering%20international&rft.au=Khilare,%20S.%20K.&rft.date=2012-03&rft.volume=28&rft.issue=2&rft.spage=193&rft.epage=202&rft.pages=193-202&rft.issn=0748-8017&rft.eissn=1099-1638&rft_id=info:doi/10.1002/qre.1233&rft_dat=%3Cwiley_cross%3EQRE1233%3C/wiley_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c3033-bbaa8e12a1dca5311e4c7087fb5ebce8dd83065123f5ea7e8e097136a79c4d563%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true