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Laser-SNMS investigations on pyrene using Ga+, Bi+1, Bi+3 and Bi+5 as primary ions and different laser wavelengths and laser power densities for photoionization

Laser secondary neutral mass spectrometry (Laser‐SNMS) has been used to simultaneously ionize sputtered secondary neutrals in a nonselective way. To investigate the sputtering and photoionization processes, we examined the dependence of the Laser‐SNMS molecular yield on (i) different primary ion bom...

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Bibliographic Details
Published in:Surface and interface analysis 2013, Vol.45 (1), p.31-34
Main Authors: GALLA, S, PELSTER, A, DRAUDE, F, ARLINGHAUS, H. F
Format: Article
Language:English
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Summary:Laser secondary neutral mass spectrometry (Laser‐SNMS) has been used to simultaneously ionize sputtered secondary neutrals in a nonselective way. To investigate the sputtering and photoionization processes, we examined the dependence of the Laser‐SNMS molecular yield on (i) different primary ion bombardment conditions using mono‐ and polyatomic ions and (ii) the laser parameters wavelength and laser power density. The Laser‐SNMS experiments were carried out using Ga + , Bi 1 + , Bi 3 + and Bi 5 + as primary ions and two different excimer laser systems for photoionization working at wavelengths of 157 and 193 nm, respectively, with power densities varying between 4 × 10 6 and 4 × 10 8  W/cm 2 . It was found that Bi 3 + as primary ion is most suited to investigate organic surfaces. The highest yields could be obtained using a laser wavelength of 157 nm after ionization. Copyright © 2012 John Wiley & Sons, Ltd.
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.4962