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Light emission from surfaces, thin films and particles induced by high-energy electron beam
Light emission generated by a high‐energy electron passing through surfaces, thin films and particles of several materials were studied using a light detection system combined with a transmission electron microscope with an accelerating voltage of 200 kV. A silver film with a rough surface gives ris...
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Published in: | Surface and interface analysis 2001-02, Vol.31 (2), p.79-86 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Light emission generated by a high‐energy electron passing through surfaces, thin films and particles of several materials were studied using a light detection system combined with a transmission electron microscope with an accelerating voltage of 200 kV. A silver film with a rough surface gives rise to inhomogeneous intensity distribution in the photon maps, which is due to the coupling of light with the non‐radiative surface plasmon mode through the surface roughness. In the case of a rough surface of a silver film with a granular structure, light is strongly emitted from a localized region with high polarization. The emissions from silver particles with various diameters were observed. The emission spectra show multiple peaks corresponding to the multipole modes of the electromagnetic oscillation in the spherical particle. The results can be explained well by the theory involving the retardation effect. Copyright © 2001 John Wiley & Sons, Ltd. |
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ISSN: | 0142-2421 1096-9918 |
DOI: | 10.1002/sia.958 |