In Situ Atomic‐Scale Observation of Monolayer MoS 2 Devices under High‐Voltage Biasing via Transmission Electron Microscopy (Small 7/2022)

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Bibliographic Details
Published in:Small (Weinheim an der Bergstrasse, Germany) Germany), 2022-02, Vol.18 (7)
Main Authors: Tseng, Yi‐Tang, Lu, Li‐Syuan, Shen, Fang‐Chun, Wang, Che‐Hung, Sung, Hsin‐Ya, Chang, Wen‐Hao, Wu, Wen‐Wei
Format: Article
Language:English
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ISSN:1613-6810
1613-6829
DOI:10.1002/smll.202270034