High Precision Pressure-Induced Lineshifts Measured with a Frequency-Stabilized Diode Laser: Application to the ν2 and (2ν2 − ν2) Bands of NH3

Pressure-induced lineshifts are measured by a new technique involving an infrared diode laser which is frequency-stabilized on the absorption peak of the studied line. Corresponding laser frequency shifts are discriminated by means of a reference cell filled with the same gas. The performance has be...

Full description

Saved in:
Bibliographic Details
Published in:Journal of molecular spectroscopy 1994-12, Vol.168 (2), p.584-592
Main Authors: Raynaud, F., Lemoine, B., Rohart, F.
Format: Article
Language:English
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Pressure-induced lineshifts are measured by a new technique involving an infrared diode laser which is frequency-stabilized on the absorption peak of the studied line. Corresponding laser frequency shifts are discriminated by means of a reference cell filled with the same gas. The performance has been demonstrated on the ν2 and (2ν2 − ν2) lines of NH3. Pressure-induced lineshifts smaller than 10 kHz/Torr (i.e., 0.25 × 10−3 cm−1/atm) are determined using a 10-Torr pressure range only. The sensitivity and reliability of this technique are critically discussed.
ISSN:0022-2852
1096-083X
DOI:10.1006/jmsp.1994.1304