Selecting measurements to test the functional behavior of analog circuits

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Bibliographic Details
Published in:Journal of electronic testing 1996-08, Vol.9 (1-2), p.9-18
Main Authors: Van Spaandonk, J., Kevenaar, T. A. M.
Format: Article
Language:English
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ISSN:0923-8174
1573-0727
DOI:10.1007/BF00137561