In situ examination of radiation-induced internal stress relaxation in the column of a high-voltage electron microscope

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Bibliographic Details
Published in:Soviet Atomic Energy 1984-03, Vol.56 (3), p.147-150
Main Authors: Novikov, I. I., Ermishkin, V. A., Zharkov, V. G., Samoilov, E. N., Lupakov, I. S., Rodchenkov, B. S.
Format: Article
Language:English
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ISSN:0038-531X
1573-8205
DOI:10.1007/BF01131455