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Ellipsometry and optical measurements on amorphous thin films of As2Se3

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Bibliographic Details
Published in:Journal of materials science 1992-03, Vol.27 (5), p.1157-1160
Main Authors: EL-OCKER, M. M, SHARAF, F, EL-MOUSLY, M. K
Format: Article
Language:English
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ISSN:0022-2461
1573-4803
DOI:10.1007/BF01142012