Electron probeX-ray microanalysis for the assessment of homogeneity of candidate reference materials at the nanogram level

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Bibliographic Details
Published in:Mikrochimica acta (1966) 1998-09, Vol.128 (3-4), p.207-213
Main Authors: Hoornaert, Stefaan, Treiger, Boris, Valkovic, Vlado, Van Grieken, René
Format: Article
Language:eng ; jpn
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ISSN:0026-3672
1436-5073
DOI:10.1007/BF01243051