Energy scan photoelectron diffraction : An integrated method for adsorbate structure determinations

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Bibliographic Details
Published in:Applied physics. A, Materials science & processing Materials science & processing, 1996-12, Vol.63 (6), p.605-611
Main Author: SCHINDLER, K.-M
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Electron diffraction and scattering
Exact sciences and technology
Physics
Solid surfaces and solid-solid interfaces
Structure of solids and liquids
crystallography
Surface structure and topography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
X-ray photoelectrons diffraction
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ISSN:0947-8396
1432-0630
DOI:10.1007/BF01567216