An efficient technique for analyzing deep level transient spectroscopy data

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Bibliographic Details
Published in:Journal of electronic materials 1989-07, Vol.18 (4), p.543-547
Main Authors: DEVRIES, P. D, AZIM KHAN, A
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron states
Exact sciences and technology
Impurity and defect levels
Physics
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ISSN:0361-5235
1543-186X
DOI:10.1007/BF02657786