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X-ray interferometers as a means of super-high-precision metrology (review)

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Bibliographic Details
Published in:	Journal of applied spectroscopy 1999-07, Vol.66 (4), p.481-492
Main Authors:	Il'in, V. N., Kobets, N. A., Leshkov, S. V.
Format:	Article
Language:	English
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Online Access:	Get full text
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