Development of Fast-Response Portable NDIR Analyzer Using Semiconductor Devices

In this paper, a novel fast response NDIR analyzer (FRNDIR), which uses an electrically pulsed semiconductor emitter and dual type PbSe detector for the PPM-level detection of carbon dioxide (CO^sub 2^) at a wavelength of 4.28 μm, is described. Modulation of conventional NDIR energy typically occurs...

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Bibliographic Details
Published in:Journal of mechanical science and technology 2003-12, Vol.17 (12), p.2099-2106
Main Authors: KIM, Woo-Seok, LEE, Jong-Hwa, PARK, Young-Moo, YOO, Jai-Suk, PARK, Kyoung-Seok
Format: Article
Language:English
Subjects:
Applied sciences
Bandpass filters
Carbon dioxide
Carbon dioxide concentration
Cutting
Detectors
Emittance
Emitters
Exact sciences and technology
General equipment and techniques
Industrial metrology. Testing
Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Lead selenides
Mechanical engineering. Machine design
Modulation
Physics
Portable equipment
R&D
Research & development
Semiconductor devices
Semiconductors
Sensors (chemical, optical, electrical, movement, gas, etc.)
remote sensing
Thermoelectric cooling
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Summary:In this paper, a novel fast response NDIR analyzer (FRNDIR), which uses an electrically pulsed semiconductor emitter and dual type PbSe detector for the PPM-level detection of carbon dioxide (CO^sub 2^) at a wavelength of 4.28 μm, is described. Modulation of conventional NDIR energy typically occurs at 1 to 20 Hz. To achieve real time highspeed measurement, the new analyzer employs a semiconductor light emitter that can be modulated by electrical chopping. Updated measurements are obtained every one millisecond. The detector has two independent lead selenide (PbSe) with IR band pass filters. Both the emitter accuracy and the detector sensitivity are increased by thermoelectric cooling of up to --20 degrees C in all semiconductor devices. Here we report the use of semiconductor devices to achieve improved performance such that these devices have potential application to CO^sub 2^ gas measurement and, in particular, the measurement of fast response CO^sub 2^ concentration at millisecond level.[PUBLICATION ABSTRACT]
ISSN:1738-494X
1226-4865
1976-3824
DOI:10.1007/BF02982450