Evaluation of standard plastic integrated circuits reliability after accelerated sequential testing

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Bibliographic Details
Published in:Annales des télécommunications 1990-11, Vol.45 (11-12), p.606-616
Main Authors: LEROSE, S, DELEUZE, G, BRIZOUX, M
Format: Article
Language:English
Subjects:
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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Summary:
ISSN:0003-4347
1958-9395
DOI:10.1007/BF02995711