Evaluation of standard plastic integrated circuits reliability after accelerated sequential testing

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Published in:Annales des télécommunications 1990-11, Vol.45 (11-12), p.606-616
Main Authors: LEROSE, S, DELEUZE, G, BRIZOUX, M
Format: Article
Language:English
Subjects:
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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container_end_page 616
container_issue 11-12
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container_title Annales des télécommunications
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creator LEROSE, S
DELEUZE, G
BRIZOUX, M
description
doi_str_mv 10.1007/BF02995711
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ispartof Annales des télécommunications, 1990-11, Vol.45 (11-12), p.606-616
issn 0003-4347
1958-9395
language eng
recordid cdi_crossref_primary_10_1007_BF02995711
source Springer Online Journal Archives
subjects Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
title Evaluation of standard plastic integrated circuits reliability after accelerated sequential testing
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