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Nouvelle classe de simulateurs permettant la caractérisation de dispositifs embarqués sur des structures de grandes dimensions
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Published in: | Annales des télécommunications 1992, Vol.47 (1-2), p.73-85 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | eng ; fre |
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cites | cdi_FETCH-LOGICAL-c1061-1062a36bd01a555ec0c636658157b7e278791f5c15f7517bed43b9641f472a5d3 |
container_end_page | 85 |
container_issue | 1-2 |
container_start_page | 73 |
container_title | Annales des télécommunications |
container_volume | 47 |
creator | ANDRIEUX, J RAINGEAUD, Y DAFIF, O JECKO, B NEGRET, D PECQUEUX, B |
description | |
doi_str_mv | 10.1007/BF02998729 |
format | article |
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fulltext | fulltext |
identifier | ISSN: 0003-4347 |
ispartof | Annales des télécommunications, 1992, Vol.47 (1-2), p.73-85 |
issn | 0003-4347 1958-9395 |
language | eng ; fre |
recordid | cdi_crossref_primary_10_1007_BF02998729 |
source | Springer LINK Archives |
title | Nouvelle classe de simulateurs permettant la caractérisation de dispositifs embarqués sur des structures de grandes dimensions |
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