X-ray reflection topographic study of growth defect and microindentation strain fields in an RDX explosive crystal

Saved in:
Bibliographic Details
Published in:Journal of materials science 1989, Vol.24 (4), p.1273-1280
Main Authors: Elban, W. L., Armstrong, R. W., Yoo, K. C., Rosemeier, R. G., Yee, R. Y.
Format: Article
Language:English
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:
ISSN:0022-2461
1573-4803
DOI:10.1007/PL00020207