Selective trap filling induced by electron pulse excitation during TSC measurement in PbI2

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Bibliographic Details
Published in:Applied physics. A, Materials science & processing Materials science & processing, 2000-08, Vol.71 (2), p.137-139
Main Authors: PONPON, J. P, STUCK, R, AMANN, M
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron states
Exact sciences and technology
Impurity and defect levels
Other nonmetals
Physics
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ISSN:0947-8396
1432-0630
DOI:10.1007/PL00021108