Selective trap filling induced by electron pulse excitation during TSC measurement in PbI2

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Published in:Applied physics. A, Materials science & processing Materials science & processing, 2000-08, Vol.71 (2), p.137-139
Main Authors: PONPON, J. P, STUCK, R, AMANN, M
Format: Article
Language:English
Subjects:
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron states
Exact sciences and technology
Impurity and defect levels
Other nonmetals
Physics
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container_title Applied physics. A, Materials science & processing
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creator PONPON, J. P
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AMANN, M
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doi_str_mv 10.1007/PL00021108
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subjects Condensed matter: electronic structure, electrical, magnetic, and optical properties
Electron states
Exact sciences and technology
Impurity and defect levels
Other nonmetals
Physics
title Selective trap filling induced by electron pulse excitation during TSC measurement in PbI2
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