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Characterization of vapor phase deposited organic molecules on silicon surfaces

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Bibliographic Details
Published in:	Fresenius' journal of analytical chemistry 1997-05, Vol.358 (1-2), p.258-262
Main Authors:	DIECKHOFF, S, HÖPER, R, SCHLETT, V, GESANG, T, POSSART, W, HENNEMANN, O.-D, GÜNSTER, J, KEMPTER, V
Format:	Article
Language:	English
Subjects:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
Citations:	Items that cite this one
Online Access:	Get full text
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