Correction of STM tip convolution effects in particle size and distance determination of metal-C:H films

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Bibliographic Details
Published in:Fresenius' journal of analytical chemistry 1997-05, Vol.358 (1-2), p.341-344
Main Authors: SCHIFFMANN, K. I, FRYDA, M, GOERIGK, G, LAUER, R, HINZE, P
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Electron, ion, and scanning probe microscopy
Exact sciences and technology
Physics
Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc
Structure and morphology
thickness
Structure of solids and liquids
crystallography
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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Description
Summary:
ISSN:0937-0633
1432-1130
DOI:10.1007/s002160050424