Structural characterization of thin films formed or changed on materials by micro Raman spectroscopy

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Bibliographic Details
Published in:Fresenius' journal of analytical chemistry 1998-08, Vol.361 (6-7), p.619-620
Main Authors: WITKE, K, BRZEZINKA, K.-W, REICH, P
Format: Article
Language:English
Subjects:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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ISSN:0937-0633
1432-1130
DOI:10.1007/s002160050969