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True atomic resolution under ambient conditions obtained by atomic force microscopy in the contact mode

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Bibliographic Details
Published in:	Applied physics. A, Materials science & processing Materials science & processing, 1999-04, Vol.68 (4), p.399-402
Main Authors:	SCHIMMEL, T, KOCH, T, KÜPPERS, J, LUX-STEINER, M
Format:	Article
Language:	English
Subjects:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
Citations:	Items that cite this one
Online Access:	Get full text
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