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Reduction of diffraction effect of UV exposure on SU-8 negative thick photoresist by air gap elimination
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Published in: | Microsystem technologies 2002-08, Vol.8 (4-5), p.308-313 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that cite this one |
Online Access: | Get full text |
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ISSN: | 0946-7076 1432-1858 |
DOI: | 10.1007/s00542-002-0176-8 |