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An accurate characterization of CRT monitor (II) proposal for an extension to CIE method and its verification

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Bibliographic Details
Published in:	Optical review (Tokyo, Japan) Japan), 2001, Vol.8 (5), p.397-408
Main Authors:	KATOH, Naoya, DEGUCHI, Tatsuya, BERNS, Roy S
Format:	Article
Language:	English
Subjects:	Display devices, liquid-crystal devices Exact sciences and technology Fundamental areas of phenomenology (including applications) Imaging and optical processing Instruments, apparatus, components and techniques common to several branches of physics and astronomy Optical elements, devices, and systems Optical instruments, equipment and techniques Optics Photometers, radiometers and colorimeters Physics
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