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Spatially oversampled TDC with digital resolution enhancement
A digital resolution enhancement technique for time-to-digital converters (TDC) is proposed. This involves a simultaneous multi-channel measurement of a time interval with low complexity TDC of varying low resolutions. The coarse outputs of each converter are digitally post-processed to obtain an ou...
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Published in: | Analog integrated circuits and signal processing 2012-03, Vol.70 (3), p.311-322 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites |
Online Access: | Get full text |
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Summary: | A digital resolution enhancement technique for time-to-digital converters (TDC) is proposed. This involves a simultaneous multi-channel measurement of a time interval with low complexity TDC of varying low resolutions. The coarse outputs of each converter are digitally post-processed to obtain an output whose precision is much better than that of the individual converters. Three post-processing algorithms are proposed and their limitations in presence of converter non-idealities are analyzed. A prototype system with 8 channels is implemented in 90 nm CMOS. 40MS/s output of each channel is algorithmically combined to obtain over 2.2–3X measured improvement in the resolution in 4/6/8 channel modes, validating the system principle. The chip occupies 0.3 mm
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and draws up to a maximum of 4 mA from a 1.2 V supply. |
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ISSN: | 0925-1030 1573-1979 |
DOI: | 10.1007/s10470-011-9669-7 |