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A rigorous peeling algorithm for direct parameter extraction procedure of HBT small-signal equivalent circuit
A new direct parameter-extraction technique applied to the small-signal equivalent circuit of heterojunction bipolar transistor (HBT) is presented. The method is based on first determining the parasitic elements and then the intrinsic elements analytically. Concerning the intrinsic parameters, all t...
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Published in: | Analog integrated circuits and signal processing 2015-12, Vol.85 (3), p.405-411 |
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Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | A new direct parameter-extraction technique applied to the small-signal equivalent circuit of heterojunction bipolar transistor (HBT) is presented. The method is based on first determining the parasitic elements and then the intrinsic elements analytically. Concerning the intrinsic parameters, all the elements are extracted using exact closed-form equations derived in terms of
S
-parameters by reducing the small-signal models to the simplified using peeling algorithm. The validity of the new extraction methodology is demonstrated by applying it to a 1 × 15 µm
2
InP HBT device within the frequency range of 0.1–40 GHz. |
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ISSN: | 0925-1030 1573-1979 |
DOI: | 10.1007/s10470-015-0586-z |