Electronic properties of HfXY intermetallic compounds (X = Si, Ge; Y = S, Se, Te)

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Published in:Hyperfine interactions 2007-04, Vol.176 (1-3), p.27-31
Main Authors: Yaar, I., Halevy, I., Kahane, S., Beck, A., Berant, Z.
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Language:English
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container_end_page 31
container_issue 1-3
container_start_page 27
container_title Hyperfine interactions
container_volume 176
creator Yaar, I.
Halevy, I.
Kahane, S.
Beck, A.
Berant, Z.
description
doi_str_mv 10.1007/s10751-008-9631-y
format article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1007_s10751_008_9631_y</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1007_s10751_008_9631_y</sourcerecordid><originalsourceid>FETCH-LOGICAL-c197t-a2b2ec2463f6d7e4542e3f5d408b32f0a5c79bc147b1535216de3cc2978175453</originalsourceid><addsrcrecordid>eNot0M1Kw0AUBeBBFKzVB3A3S4WO3js_mQRxIaW2QkGkFdrVkEzuQCRtwkxc9O1tqatzFoez-Bi7R3hCAPucEKxBAZCLIlMoDhdshMZKURgNl2wECrRQuVbX7CalHwCQFosR-5q15IfY7RvP-9j1FIeGEu8CX4TNljf7geKOhrJtjwPf7frud18n_rDhr3zVTPicXvj21Cd8RRO-psdbdhXKNtHdf47Z9_tsPV2I5ef8Y_q2FB4LO4hSVpK81JkKWW1JGy1JBVNryCslA5TG26LyqG2FRhmJWU3Ke1nYHK3RRo0Znn997FKKFFwfm10ZDw7BnUzc2cQdTdzJxB3UH-NqUeI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Electronic properties of HfXY intermetallic compounds (X = Si, Ge; Y = S, Se, Te)</title><source>Springer Link</source><creator>Yaar, I. ; Halevy, I. ; Kahane, S. ; Beck, A. ; Berant, Z.</creator><creatorcontrib>Yaar, I. ; Halevy, I. ; Kahane, S. ; Beck, A. ; Berant, Z.</creatorcontrib><identifier>ISSN: 0304-3843</identifier><identifier>EISSN: 1572-9540</identifier><identifier>DOI: 10.1007/s10751-008-9631-y</identifier><language>eng</language><ispartof>Hyperfine interactions, 2007-04, Vol.176 (1-3), p.27-31</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c197t-a2b2ec2463f6d7e4542e3f5d408b32f0a5c79bc147b1535216de3cc2978175453</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Yaar, I.</creatorcontrib><creatorcontrib>Halevy, I.</creatorcontrib><creatorcontrib>Kahane, S.</creatorcontrib><creatorcontrib>Beck, A.</creatorcontrib><creatorcontrib>Berant, Z.</creatorcontrib><title>Electronic properties of HfXY intermetallic compounds (X = Si, Ge; Y = S, Se, Te)</title><title>Hyperfine interactions</title><issn>0304-3843</issn><issn>1572-9540</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNot0M1Kw0AUBeBBFKzVB3A3S4WO3js_mQRxIaW2QkGkFdrVkEzuQCRtwkxc9O1tqatzFoez-Bi7R3hCAPucEKxBAZCLIlMoDhdshMZKURgNl2wECrRQuVbX7CalHwCQFosR-5q15IfY7RvP-9j1FIeGEu8CX4TNljf7geKOhrJtjwPf7frud18n_rDhr3zVTPicXvj21Cd8RRO-psdbdhXKNtHdf47Z9_tsPV2I5ef8Y_q2FB4LO4hSVpK81JkKWW1JGy1JBVNryCslA5TG26LyqG2FRhmJWU3Ke1nYHK3RRo0Znn997FKKFFwfm10ZDw7BnUzc2cQdTdzJxB3UH-NqUeI</recordid><startdate>200704</startdate><enddate>200704</enddate><creator>Yaar, I.</creator><creator>Halevy, I.</creator><creator>Kahane, S.</creator><creator>Beck, A.</creator><creator>Berant, Z.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200704</creationdate><title>Electronic properties of HfXY intermetallic compounds (X = Si, Ge; Y = S, Se, Te)</title><author>Yaar, I. ; Halevy, I. ; Kahane, S. ; Beck, A. ; Berant, Z.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c197t-a2b2ec2463f6d7e4542e3f5d408b32f0a5c79bc147b1535216de3cc2978175453</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yaar, I.</creatorcontrib><creatorcontrib>Halevy, I.</creatorcontrib><creatorcontrib>Kahane, S.</creatorcontrib><creatorcontrib>Beck, A.</creatorcontrib><creatorcontrib>Berant, Z.</creatorcontrib><collection>CrossRef</collection><jtitle>Hyperfine interactions</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yaar, I.</au><au>Halevy, I.</au><au>Kahane, S.</au><au>Beck, A.</au><au>Berant, Z.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electronic properties of HfXY intermetallic compounds (X = Si, Ge; Y = S, Se, Te)</atitle><jtitle>Hyperfine interactions</jtitle><date>2007-04</date><risdate>2007</risdate><volume>176</volume><issue>1-3</issue><spage>27</spage><epage>31</epage><pages>27-31</pages><issn>0304-3843</issn><eissn>1572-9540</eissn><doi>10.1007/s10751-008-9631-y</doi><tpages>5</tpages></addata></record>
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1572-9540
language eng
recordid cdi_crossref_primary_10_1007_s10751_008_9631_y
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title Electronic properties of HfXY intermetallic compounds (X = Si, Ge; Y = S, Se, Te)
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T17%3A58%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electronic%20properties%20of%20HfXY%20intermetallic%20compounds%20(X%20=%20Si,%20Ge;%20Y%20=%20S,%20Se,%20Te)&rft.jtitle=Hyperfine%20interactions&rft.au=Yaar,%20I.&rft.date=2007-04&rft.volume=176&rft.issue=1-3&rft.spage=27&rft.epage=31&rft.pages=27-31&rft.issn=0304-3843&rft.eissn=1572-9540&rft_id=info:doi/10.1007/s10751-008-9631-y&rft_dat=%3Ccrossref%3E10_1007_s10751_008_9631_y%3C/crossref%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c197t-a2b2ec2463f6d7e4542e3f5d408b32f0a5c79bc147b1535216de3cc2978175453%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true