Aluminum-doped zinc oxide electrode for robust (Pb,La)(Zr,Ti)O3 capacitors: effect of oxide insulator encapsulation and oxide buffer layer

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Bibliographic Details
Published in:Journal of materials science. Materials in electronics 2014-05, Vol.25 (5), p.2155-2161
Main Authors: Takada, Yoko, Tsuji, Toru, Okamoto, Naoki, Saito, Takeyasu, Kondo, Kazuo, Yoshimura, Takeshi, Fujimura, Norifumi, Higuchi, Koji, Kitajima, Akira, Oshima, Akihiro
Format: Article
Language:English
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ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-014-1853-y