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Sizes of Nanostructured Elements in Granular Conductor–Dielectric Composite Films Determined by Calculation and Atomic Force Microscopy
Granular composite films based on BaB 6 –LaB 6 , Sn 0.9 Sb 0.1 O 2 , and alumina borosilicate glass produced by screen-printing followed by heat treatment are studied. To find the thicknesses of nanosized dielectric layers between the conducting particles, predetermining the conductivity mechanism a...
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| Published in: | Powder metallurgy and metal ceramics 2015-06, Vol.54 (1-2), p.23-30 |
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| Main Authors: | , |
| Format: | Article |
| Language: | English |
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| cites | cdi_FETCH-LOGICAL-c380t-6c815c904d8e5f294a3d77ef4402cbe51423a8e6ac297a772a7ba8f0309b5f433 |
| container_end_page | 30 |
| container_issue | 1-2 |
| container_start_page | 23 |
| container_title | Powder metallurgy and metal ceramics |
| container_volume | 54 |
| creator | Rud, B. M. Shelud’ko, V. E. |
| description | Granular composite films based on BaB
6
–LaB
6
, Sn
0.9
Sb
0.1
O
2
, and alumina borosilicate glass produced by screen-printing followed by heat treatment are studied. To find the thicknesses of nanosized dielectric layers between the conducting particles, predetermining the conductivity mechanism and film properties, a novel calculation method is used. To evaluate the reliability of the results, film structures are studied by atomic force microscopy. The calculated data are in good agreement with the experiment. The method may be applied in examining the structure and properties of new conductor–dielectric composites. |
| doi_str_mv | 10.1007/s11106-015-9675-x |
| format | article |
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6
–LaB
6
, Sn
0.9
Sb
0.1
O
2
, and alumina borosilicate glass produced by screen-printing followed by heat treatment are studied. To find the thicknesses of nanosized dielectric layers between the conducting particles, predetermining the conductivity mechanism and film properties, a novel calculation method is used. To evaluate the reliability of the results, film structures are studied by atomic force microscopy. The calculated data are in good agreement with the experiment. The method may be applied in examining the structure and properties of new conductor–dielectric composites.</description><identifier>ISSN: 1068-1302</identifier><identifier>EISSN: 1573-9066</identifier><identifier>DOI: 10.1007/s11106-015-9675-x</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Ceramics ; Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Composites ; Glass ; Materials Science ; Metallic Materials ; Nanostructured Materials ; Natural Materials</subject><ispartof>Powder metallurgy and metal ceramics, 2015-06, Vol.54 (1-2), p.23-30</ispartof><rights>Springer Science+Business Media New York 2015</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c380t-6c815c904d8e5f294a3d77ef4402cbe51423a8e6ac297a772a7ba8f0309b5f433</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27923,27924</link.rule.ids></links><search><creatorcontrib>Rud, B. M.</creatorcontrib><creatorcontrib>Shelud’ko, V. E.</creatorcontrib><title>Sizes of Nanostructured Elements in Granular Conductor–Dielectric Composite Films Determined by Calculation and Atomic Force Microscopy</title><title>Powder metallurgy and metal ceramics</title><addtitle>Powder Metall Met Ceram</addtitle><description>Granular composite films based on BaB
6
–LaB
6
, Sn
0.9
Sb
0.1
O
2
, and alumina borosilicate glass produced by screen-printing followed by heat treatment are studied. To find the thicknesses of nanosized dielectric layers between the conducting particles, predetermining the conductivity mechanism and film properties, a novel calculation method is used. To evaluate the reliability of the results, film structures are studied by atomic force microscopy. The calculated data are in good agreement with the experiment. The method may be applied in examining the structure and properties of new conductor–dielectric composites.</description><subject>Ceramics</subject><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Composites</subject><subject>Glass</subject><subject>Materials Science</subject><subject>Metallic Materials</subject><subject>Nanostructured Materials</subject><subject>Natural Materials</subject><issn>1068-1302</issn><issn>1573-9066</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNp9kLFOwzAQhi0EEqXwAGx-AYMdJ3EyVmkLSAUGYLYc54JcJXZlu1LLxMrMG_IkuCoz051O_3d3-hC6ZvSGUSpuA2OMloSygtSlKMjuBE1YITipaVmepp6WFWGcZufoIoQ1pYnK2QR9vZgPCNj1-ElZF6Lf6rj10OHFACPYGLCx-M4rux2Ux42zXQo4__P5PTcwgI7e6DQeNy6YCHhphjHgOUTwo7FpTbvHjRp0oqNxFivb4Vl0Y4KWzmvAj0Z7F7Tb7C_RWa-GAFd_dYrelovX5p6snu8emtmKaF7RSEpdsULXNO8qKPqszhXvhIA-z2mmWyhYnnFVQal0VgslRKZEq6qeclq3RZ9zPkXsuPdwOHjo5cabUfm9ZFQeXMqjS5lcyoNLuUtMdmRCytp38HLttt6mN_-BfgGsvHum</recordid><startdate>20150612</startdate><enddate>20150612</enddate><creator>Rud, B. M.</creator><creator>Shelud’ko, V. E.</creator><general>Springer US</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20150612</creationdate><title>Sizes of Nanostructured Elements in Granular Conductor–Dielectric Composite Films Determined by Calculation and Atomic Force Microscopy</title><author>Rud, B. M. ; Shelud’ko, V. E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c380t-6c815c904d8e5f294a3d77ef4402cbe51423a8e6ac297a772a7ba8f0309b5f433</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Ceramics</topic><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Composites</topic><topic>Glass</topic><topic>Materials Science</topic><topic>Metallic Materials</topic><topic>Nanostructured Materials</topic><topic>Natural Materials</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rud, B. M.</creatorcontrib><creatorcontrib>Shelud’ko, V. E.</creatorcontrib><collection>CrossRef</collection><jtitle>Powder metallurgy and metal ceramics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rud, B. M.</au><au>Shelud’ko, V. E.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sizes of Nanostructured Elements in Granular Conductor–Dielectric Composite Films Determined by Calculation and Atomic Force Microscopy</atitle><jtitle>Powder metallurgy and metal ceramics</jtitle><stitle>Powder Metall Met Ceram</stitle><date>2015-06-12</date><risdate>2015</risdate><volume>54</volume><issue>1-2</issue><spage>23</spage><epage>30</epage><pages>23-30</pages><issn>1068-1302</issn><eissn>1573-9066</eissn><abstract>Granular composite films based on BaB
6
–LaB
6
, Sn
0.9
Sb
0.1
O
2
, and alumina borosilicate glass produced by screen-printing followed by heat treatment are studied. To find the thicknesses of nanosized dielectric layers between the conducting particles, predetermining the conductivity mechanism and film properties, a novel calculation method is used. To evaluate the reliability of the results, film structures are studied by atomic force microscopy. The calculated data are in good agreement with the experiment. The method may be applied in examining the structure and properties of new conductor–dielectric composites.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11106-015-9675-x</doi><tpages>8</tpages></addata></record> |
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| identifier | ISSN: 1068-1302 |
| ispartof | Powder metallurgy and metal ceramics, 2015-06, Vol.54 (1-2), p.23-30 |
| issn | 1068-1302 1573-9066 |
| language | eng |
| recordid | cdi_crossref_primary_10_1007_s11106_015_9675_x |
| source | Springer Nature:Jisc Collections:Springer Nature Read and Publish 2023-2025: Springer Reading List |
| subjects | Ceramics Characterization and Evaluation of Materials Chemistry and Materials Science Composites Glass Materials Science Metallic Materials Nanostructured Materials Natural Materials |
| title | Sizes of Nanostructured Elements in Granular Conductor–Dielectric Composite Films Determined by Calculation and Atomic Force Microscopy |
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