Determination of capacitance-voltage characteristics of organic semiconductor devices by combined current-voltage and voltage decay measurements

We present in this paper a new method,based on measurements of conventional direct current-voltage（I-V） characteristics and transient voltage-time（V-t） characteristics during the discharge process,for determining capacitance-voltage（C-V） characteris-tics of organic semiconductor devices.Derivatives...

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Published in:Science China Technological Sciences 2011-04, Vol.54 (4), p.826-829
Main Authors: Li, Nuo, Gao, XinDong, Ding, BaoFu, Sun, XiaoYu, Ding, XunMin, Hou, XiaoYuan
Format: Article
Language:English
Subjects:
Engineering
半导体器件
有机半导体
测量设备
电压特性
电容电压
电流电压
衰减测量
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cited_by cdi_FETCH-LOGICAL-c315t-4248a006c1ca7298d0ae430e13c989a9aa9f3f81e03b716950827f1925442baa3
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container_title Science China Technological Sciences
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creator Li, Nuo
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description We present in this paper a new method,based on measurements of conventional direct current-voltage（I-V） characteristics and transient voltage-time（V-t） characteristics during the discharge process,for determining capacitance-voltage（C-V） characteris-tics of organic semiconductor devices.Derivatives of I-V and V-t,dI/dV and dV/dt,are related with C by a simple formula C=-V（dI/dV）/（dV/dt）The validity of the method is confirmed by experimental data measured from a set of single-organic-layer devices with different layer thicknesses.
doi_str_mv 10.1007/s11431-010-4270-3
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subjects Engineering
半导体器件
有机半导体
测量设备
电压特性
电容电压
电流电压
衰减测量
title Determination of capacitance-voltage characteristics of organic semiconductor devices by combined current-voltage and voltage decay measurements
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