Evolution of microstructure and texture of cold-drawn polycrystalline Ag with low stacking fault energy

• Published in: Science China. Technological sciences 2015-07, Vol.58 (7), p.1146-1153
• Main Authors: Ma, XiaoGuang, Chen, Jian, Chen, Zheng, Yan, Wen
• Format: Article
• Language: English
• Subjects: Engineering; 多晶结构; 层错能; 演变; 电子背散射衍射; 组织; 织构; 透射电子显微镜; 银
• ISSN: 1674-7321; 1869-1900
• DOI: 10.1007/s11431-015-5862-8

The evolution of microstructure and texture for drawn polycrystalline Ag was investigated by transmission electron microsco- py and electron backscattering diffraction. The results show that there are deformation twins and some un-tangled discrete dis-locations at low strains. When the strain is increased to 0.58, a lot of high density dislocation walls and microbands come into being. At the same time, some twins lose the twinning relationship of 60°〈111〉. At a strain of 0.94, both dislocation boundaries and twin boundaries will rotate to the axis direction of wires and the shear bands start to appear. When the strain is higher than 1.96, most of the boundaries are parallel to the drawn direction. Texture analysis indicates that with the strain increasing, the volume fraction of complex texture component decreases, but 〈111〉 and 〈100〉 texture components increase. However, the variation in the volume fraction of each texture component as strains is not evident when the strains are higher than 0.58. For polycrystalline Ag with low stacking fault energy, complex texture components are easily formed.