TM polarization characteristics on thermal radiation of a negative refractive index thin film

Thermal radiation TM polarization characteristics of a negative refractive index thin film was studied based on the transmit matrix method and Kirchhoff radiation law. The influence of the thin film parameters on the thermal radiation directional characteristics and spectral property were discussed....

Full description

Saved in:
Bibliographic Details
Published in:Chinese science bulletin 2009-05, Vol.54 (10), p.1663-1668
Main Authors: Cui, Yi, Huang, Yong, Li, Wen, Wan, Jun
Format: Article
Language:English
Subjects:
Articles/Engineering Thermophysics
Chemistry/Food Science
Earth Sciences
Engineering
Humanities and Social Sciences
Life Sciences
multidisciplinary
Physics
Science
Science (multidisciplinary)
偏振特性
光子隧道效应
光谱性质
方向特性
热辐射
薄膜参数
负折射率
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Thermal radiation TM polarization characteristics of a negative refractive index thin film was studied based on the transmit matrix method and Kirchhoff radiation law. The influence of the thin film parameters on the thermal radiation directional characteristics and spectral property were discussed. And the influence of the evanescent waves was also discussed. The results show that two factors play important roles in the thermal radiation of negative index thin film： one is the interference effect of the thin film structure to the electromagnetic waves; the other is the photon tunneling effect of the negative refractive index material, which was caused by the amplifying evanescent wave. These indicate that spectral and directional characteristics of the thermal emissivity can be modulated by modifying the structure and the physics parameters of the negative refraction index thin film.
ISSN:1001-6538
2095-9273
1861-9541
2095-9281
DOI:10.1007/s11434-009-0152-0