Elimination of bistability in constant-phase mode in atomic force microscopy

By presenting the phase properties of bistability in amplitude-modulation atomic force microscopy, we put forward a technique, the constant-phase mode, which may eliminate bistability. Using this approach, we keep the phase shift between driving and oscillation constant, slightly above −90°. In addi...

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Bibliographic Details
Published in:Chinese science bulletin 2012-02, Vol.57 (5), p.460-465
Main Authors: Li, YingZi, Qian, JianQiang, Li, XiaoFeng, Li, Yuan, Hua, BaoCheng, Yao, JunEn
Format: Article
Language:English
Subjects:
algorithms
atomic force microscopy
Chemistry/Food Science
Earth Sciences
Engineering
Humanities and Social Sciences
Life Sciences
mathematical models
multidisciplinary
Physics
Science
Science (multidisciplinary)
原子力显微镜
双稳态
定阶
数值模拟
相位特性
相模式
驾驶执照
高振幅
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Summary:By presenting the phase properties of bistability in amplitude-modulation atomic force microscopy, we put forward a technique, the constant-phase mode, which may eliminate bistability. Using this approach, we keep the phase shift between driving and oscillation constant, slightly above −90°. In addition to the adjustment of the free amplitude, we add to amplitude-modulation atomic force microscopy another feedback so that the tip always oscillates in the high-amplitude state. A numerical simulation is carried out to demonstrate that the algorithm prevents bistability effectively.
ISSN:1001-6538
1861-9541
DOI:10.1007/s11434-011-4825-0