Elimination of bistability in constant-phase mode in atomic force microscopy

By presenting the phase properties of bistability in amplitude-modulation atomic force microscopy, we put forward a technique, the constant-phase mode, which may eliminate bistability. Using this approach, we keep the phase shift between driving and oscillation constant, slightly above −90°. In addi...

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Published in:Chinese science bulletin 2012-02, Vol.57 (5), p.460-465
Main Authors: Li, YingZi, Qian, JianQiang, Li, XiaoFeng, Li, Yuan, Hua, BaoCheng, Yao, JunEn
Format: Article
Language:English
Subjects:
algorithms
atomic force microscopy
Chemistry/Food Science
Earth Sciences
Engineering
Humanities and Social Sciences
Life Sciences
mathematical models
multidisciplinary
Physics
Science
Science (multidisciplinary)
原子力显微镜
双稳态
定阶
数值模拟
相位特性
相模式
驾驶执照
高振幅
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container_issue 5
container_start_page 460
container_title Chinese science bulletin
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creator Li, YingZi
Qian, JianQiang
Li, XiaoFeng
Li, Yuan
Hua, BaoCheng
Yao, JunEn
description By presenting the phase properties of bistability in amplitude-modulation atomic force microscopy, we put forward a technique, the constant-phase mode, which may eliminate bistability. Using this approach, we keep the phase shift between driving and oscillation constant, slightly above −90°. In addition to the adjustment of the free amplitude, we add to amplitude-modulation atomic force microscopy another feedback so that the tip always oscillates in the high-amplitude state. A numerical simulation is carried out to demonstrate that the algorithm prevents bistability effectively.
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subjects algorithms
atomic force microscopy
Chemistry/Food Science
Earth Sciences
Engineering
Humanities and Social Sciences
Life Sciences
mathematical models
multidisciplinary
Physics
Science
Science (multidisciplinary)
原子力显微镜
双稳态
定阶
数值模拟
相位特性
相模式
驾驶执照
高振幅
title Elimination of bistability in constant-phase mode in atomic force microscopy
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